Open source software to help prepare virtual tests
The first stable version of the blenDIC add-on has been released. It is a photo-realistic image generation tool for setting up and performing virtual tests involving digital image correlation using the open source 3D animation software Blender. BlenDIC is an open source (GPL) add-on to Blender that encapsulates a large number of tools allowing Blender…
Hybrid calibration : a robust alternative to self-calibration
Introduction This article is written as a complement to the article on good calibration practices recently published on our website (https://eikosim.com/en/technical-articles/mastering-self-calibration-with-eikotwin-dic/). In general, it is very often possible to calibrate the camera system in EikoTwin-DIC thanks to the knowledge of the geometry of the part, and of the correspondence between points of the model and…
How to calculate the size of the speckle pattern using our spreadsheet to ensure a good measurement quality?
In a previous article, we discussed how to choose the size of the speckle spots for your experiment. We introduced the necessary parameters to control in order to optimize the size of your speckle for each of your tests. As mentioned, although the quality of a speckle pattern can only be analysed with respect to…
Mastering self-calibration with EikoTwin-DIC
To provide accurate digital image correlation (DIC) results, the EikoTwin-DIC software must first calibrate the camera system. This is made using images of the structure in its reference state (unloaded). Using these images, the software determines the intrinsic parameters (the cameras focal lengths, optical centers, skews) and extrinsic parameters (camera positions and orientations in the…
EikoTwin DIC gets its 1.2 update !
Version 1.2 of EikoTwin DIC is available ! Here is a short-list of the main updates : EikoTwin DIC welcomes hybrid calibration! More robust (especially in the case of near-plane specimens), this new technique allow to calibrate separately your cameras intrinsic and extrinsic parameters, thanks to a one-of-a-kind calibration target. For more information, please contact…
Design and validation of laser impact tests
Redactors: C.Minguet, F.Mathieu – EikoSim ; E.Chalumeau – ALPhANOV ; F.Hild – Université Paris-Saclay, ENS Paris-Saclay, CNRS ; R.Peiffer, S.Carpier – MBDA ALPhANOV[1], optics and lasers technology centre based in Talence since 2007, and MBDA[2], European leader in the Defence sector, have had a joint laboratory since 2019 for laser-matter interaction comprised of a cabin equipped with a…
High-temperature tests for ceramic matrix composites
Context As a new member of EikoSim team, I was offered the opportunity to present an overlook of my thesis work dealing with high-temperature experiments for SiC/SiC composites, which was carried out in LMT under the supervision of F. Hild and in collaboration with Safran Ceramics under the supervision of V. Herb and B. Lacombe.…
What is a good DIC speckle pattern ?
In another article, we talked about the different techniques for creating a speckle pattern in digital image correlation, including the ability to vary the size and nature of the spots projected on the piece. But what size should your speckle pattern be? There is no “good” or “bad” speckle, or rather one cannot judge the…
EikoTwin Digital Twin gets its 1.1 update !
Version 1.1 of EikoTwin Digital Twin is available! To obtain it, please contact your local EikoSim contact point. In particular, two structural improvements are on the menu: The appearance of the Step Designer, a dedicated interface for preparing your enhanced simulation. It will allow you to visualize and control the preparation phase of your simulation:…
Speckle patterns and Digital Image Correlation
Context The principle of image correlation is based on tracking information from a so-called “reference” image in the following images, often called “distorted images”. All of the images form a film, from which we seek to extract a measure. We can therefore see the correlation of images as following points over the entire observed surface:…
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